interactive app

EM Detectability

This app provides a capability to explore detectability of a target layer using an electromagnetic (EM) experiment. Detectability can be defined as

Detectability (%)=100×1N∑i=1N(Fi[ρ1]−Fi[ρ2]Fi[ρ2])2\text{Detectability} \ (\%) = 100 \times \frac{1}{N}\sum_{i=1}^{N}\Big(\frac{F_i[\rho_{\text{1}}] - F_i[\rho_{\text{2}}]}{F_i[\rho_{\text{2}}]}\Big)^2
(1)

where NN is the number of data; Fi[⋅]F_i[\cdot] is a EM simulation operator calculating EM datum at i-th time channel; ρ1\rho_{1} and ρ2\rho_{2} are vertical resistivity profiles. For instance, ρ1\rho_{1} and ρ2\rho_{2} could correspond ρlayer\rho_{\text{layer}}, a vertical resistivity profile with a layer, and ρb\rho_{\text{b}}, a homogenous background resistivity, respectively. In such a case, the detectability is an anomalous layer response normalized by the background response in percentage.

Interactive App

Source:EM Detectability

Usage

App parameters

  • EM system: AEM or tTEM
  • Use Profile 2: if checked, the app allow user to edit the second vertical resistivity profile; if not, the second resistvity profile is set to be homogeneous background.
  • z: depth to the layer
  • h: thickness of the layer
  • rho_b: background resistivity
  • rho: layer resistivity

Plotting parameters

  • Resistivity range: range of resistivity shown in the left panel
  • Depth range: range of depth shown in the left panel