interactive app

EM Depth of Investigation

Depth of investigation (DOI) indicates a depth where changes in resistivity values does not make noticeable changes in the observed EM data. This app provides a way to estimate DOI. Generally, DOI is dependent upon EM system, level of data errors/noise, and subsurface resistivity. This tool provides a capability to explore how DOI changes with above three factors.

Interactive App

Source:EM Depth of Investigation

Usage

App parameters

  • EM system: AEM or tTEM
  • halfspace: if checked, then assumes the homogenous background.
  • z: depth to the layer
  • h: thickness of the layer
  • rho_b: background resistivity
  • rho: layer resistivity
  • rho_0: initial resistivity profile
  • % error: percentage error
  • threshold: a threshold value to determine DOI.

Plotting parameters

  • Resistivity range: range of resistivity shown in the left panel
  • Depth range: range of depth shown in the left panel
  • DOI index: range of DOI index shown in the right panel