EM Survey Design

Setting the relevant expectation about what electromagnetic (EM) imaging can provide or NOT is critical before or after an EM survey. By combining the three other apps: 1) detectability, 2) inversion, 3) depth of investigation, this app provides a capability to evaluate the feasbility of the survey or the obtained resistivity model (after the survey).

Interactive App¶

Source:EM Survey Design

Usage¶

App parameters¶

• EM system: AEM or tTEM

• Simulation or Inversion:

  • Sim: Simulation mode

  • Inv: Inversion mode

• z: depth to the layer

• h: thickness of the layer

• rho_b: background resistivity

• rho: layer resistivity

• % error: percentage error

• threshold: a threshold value to determine depth of investigation (DOI).

Plotting parameters¶

• Resistivity range: range of resistivity shown in the left panel

• Depth range: range of depth shown in the left panel